New JAI Wave series SWIR line scan cameras

High sensitivity, 1K and 2K resolution and GigE Vision interface

JAI has expanded its Wave Series with two new high-performance short-wave infrared (SWIR) line scan cameras, the WAL-1001-GE and WAL-2001-GE. These cameras are engineered to deliver precise subsurface inspection, defect detection, and material differentiation across challenging industrial environments. By integrating high-sensitivity imaging with standard interfaces, they offer a reliable solution for complex machine vision tasks.

Simplified system integration

Both new models feature a GigE Vision interface, ensuring efficient data transfer and straightforward integration into existing factory setups. The inclusion of a standard C-mount and a 12.8 mm sensor width means businesses can utilise a wide range of standard lenses. This design minimises the need for specialised components, reducing overall system complexity and deployment costs.

Key Features

WAL-1001-GE (1K Model): Offers a 1 × 1024-pixel resolution sensor with large 12.5 µm × 12.5 µm square pixels, sensitivity from 900nm to 1700nm and line rates up to 29 kHz.

WAL-2001-GE (2K Model): Delivers 2K resolution via a dual-line architecture with 12.5um pixels and by offsetting each line by 0.5-pixels, it delivers an equivalent 6.25 µm pixel pitch with sensitivity from 900nm to 1700nm and line rates up to 40 kHz.

High quantum efficiency: Reaches up to 83% peak efficiency across the SWIR spectrum for superior low-light performance.

Flexible image output: Supports Mono 8-, 10-, 12-, and 14-bit options for precise intensity data and smooth grayscale transitions.

On-Camera controls: Performs real-time image processing directly inside the 2K camera, removing the need for external acquisition hardware.

High-sensitivity sensor technology

Built around large 12.5 µm square pixels, the cameras achieve an almost constant quantum efficiency across the SWIR spectrum but peaks at up to 83% at 1440nm. This high sensitivity ensures an exceptional signal-to-noise ratio, allowing for accurate imaging in low-light conditions or with high-speed operations. Furthermore, the support for up to 14-bit mono output provides better grey scale differentiation and high dynamic range to produce more precise intensity data for demanding measurements.

Advanced pixel offset

While the WAL-1001-GE offers a reliable single line 1K resolution at 29 kHz, the WAL-2001-GE pushes performance further by utilising a dual-line architecture with a 0.5-pixel offset. This pixel-shift design effectively doubles the resolution to 2K and achieves a line rate of up to 40 kHz, allowing the camera to detect sub-pixel-scale defects. Because the image synthesis occurs in real time within the camera, users can upgrade from a 1K to a 2K system without changing their existing optics, lighting, or working distance.

Applications

Fruit and vegetable sorting and grading Detect moisture, contamination, and foreign materials while enabling grading based on bruising, ripeness, or early mould development. SWIR imaging also enables differentiation between visually similar products.

Recycling Identify and separate plastics such as PET, PE, PP, and PS on high-speed conveyors. SWIR contrast also enables detection of black and dark plastics that are difficult to distinguish with visible or near-infrared imaging.

Pharmaceutical and fill level inspection Enable continuous inspection of vials, ampoules, and blister packaging on high-speed production lines, supporting reliable fill-level verification and detection of missing or defective products.

Plastic seal inspection Provides reliable verification of heat-seal width, seal consistency, and seal strength in transparent or opaque packaging, while identifying seal defects, including bubbles, wrinkles, and improper sealing, as well as detecting closure strips and other features that are difficult to identify with visible-light imaging.

Wafer inspection Reveal subsurface cracks caused by thermal stress, inspect coatings and residues, perform edge inspection, and enable precise wafer alignment by visualizing features through silicon.

Exploring SWIR line scan cameras for your application?

Speak with Adept Turnkey about JAI Wave Series SWIR line scan cameras for industrial inspection, sorting and material separation.

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