New
512 pixel resolution Linea SWIR with cutting-edge InGaAs sensor
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Outstanding
addition to Linea SWIR family |
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Suited to a broad range of machine vision applications, particularly
solar panel inspection, silicon wafer inspection and food sorting,
Teledyne DALSAs 512 pixel GigE SWIR line scan camera comes
equipped with a cutting-edge InGaAs sensor - all part of a compact
package.
The latest member of the Linea family features 25 µm pixels
in a 512 linea array and offers a line rate of up to 40 kHz line
rate. With high speed, high sensitivity, cycling mode, and programmable
I/Os, the versatile Linea SWIR provides reliability and phenomenal
performance.
With high speed, high sensitivity and programmable I/Os the extremely
versatile Linea SWIR is suited to applications like
optical sorting, solar
panel inspection and general
purpose machine vision.
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Solar
Panel Inspection |
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Silicon
Wafer Inspection |
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Food
Sorting |
Cracks,
defects, saw marks, dead spots and damage difficult for the human
eye to detect, is easily identified with the Linea SWIR. |
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The Linea SWIR
can see straight through silicon allowing end users to image the target
on the back of the wafer. |
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Highly functional
in detecting moisture content, bruising and foreign objects the linea
SWIR will increase yield and productivity while reducing waste. |
The Linea SWIR camera offers
a range of features:
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• 512 pixel resolution
• Pixel size of 25 µm
• 950 to 1700 nm spectral band
• 40 kHz line rate
• HDR mode
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• Cycling mode
• Programmable I/Os
• Compact form
• Configurable, full well
• GigE, PoE
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Quick Specifications
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Peak Quantum Efficiency
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66%
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Resolution
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512 Pixels
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Pixel Size
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25 µm
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Spectral Band
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950 to 1700 nm
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Line rate
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40 kHz
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Need a price or more application
information? Please email
Adept Turnkey or call our offices
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